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    YANG Yanlong, ZHOU Zhichao, ZHAO Naisheng, WU Jia, LUO Yi. Application of electron backscatter diffraction technology in grain size assessment of high-grade coiled tubing[J]. PHYSICAL TESTING AND CHEMICAL ANALYSIS PART A:PHYSICAL TESTING, 2023, 59(11): 4-6. DOI: 10. 11973/lhjy-wl202311002
    Citation: YANG Yanlong, ZHOU Zhichao, ZHAO Naisheng, WU Jia, LUO Yi. Application of electron backscatter diffraction technology in grain size assessment of high-grade coiled tubing[J]. PHYSICAL TESTING AND CHEMICAL ANALYSIS PART A:PHYSICAL TESTING, 2023, 59(11): 4-6. DOI: 10. 11973/lhjy-wl202311002

    Application of electron backscatter diffraction technology in grain size assessment of high-grade coiled tubing

    • The grain size of high-grade coiled tubing products was relatively small, and traditional metallographic testing methods could not accurately evaluate their grain size. Using a combination of metallographic examination and electron backscatter diffraction technology, the grain size of different grades of coiled tubing products was studied. The results show that using electron backscatter diffraction technology could accurately evaluate the grain size of high-level coiled tubing, and the average grain equicircle diameter of CT90 coiled tubing was 2. 89 μm. The average grain equicircle diameter of CT110 coiled tubing was 1. 37 μm.
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